Traditionally, annual temperature mapping involves placing temperature data loggers at various points within a storage or manufacturing environment (e.g., warehouses, cold rooms, incubators), collecting data for a specified period (e.g., 24-72 hours), and then manually retrieving and analyzing this data. While essential for qualification and validation, this method is time-consuming, labor-intensive, and provides only a snapshot of conditions, potentially missing transient excursions between mapping events.